This study compares measurements using current state-of-the-art of CT and CMM on artifacts with internal features and compliant structures. 5 μm, while expanded uncertainties for the CT measurements kleppner-d kolenkow-r.j introduction-to-mechanics-2014 solution manual pdf from 1 to 20 μm. Practical solutions for measuring parts with compliant features are offered and shown to reduce measurement uncertainties. Some of the issues with recently developed standards for CT measurement uncertainty estimation are discussed.
A generalized formalism for uncertainty budgeting in CT metrology is applied to the measurements of artifacts presented in this paper. Through the development of standards it is also becoming accepted as a metrology tool. It also aims to discuss some of the issues with recently developed standards for CT measurement uncertainty estimation. For dimensions of geometric features ranging from 0. 6 mm to 65 mm, a comparison between CT and CMM measurements typically resulted in differences of approximately 5 μm or less for most of the measurements, while expanded uncertainties computed for the CT measurements ranged from 1 to 20 μm. CT measurements on the internal geometries resulted in uncertainties comparable to CMM data that were obtained with the metallic artifact disassembled.
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